METHOD FOR PROVIDING POSITION INFORMATION FOR RETRIEVING A TARGET POSITION IN A MICROSCOPIC SAMPLE, METHOD FOR EXAMINING AND/OR PROCESSING SUCH A TARGET POSITION AND MEANS FOR IMPLEMENTING THESE METHODS

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20240411123A1
SERIAL NO

18705602

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A method for providing position information for retrieving a target position in a microscopic sample includes providing a first representation of the sample at a first resolution including the target position; specifying a first target position identifier indicating the target position at the first resolution; acquiring an image stack comprising the target position indicated by the first target position identifier; providing a second representation at a second resolution higher than the first resolution based on the image stack; specifying a second target position identifier indicating the target position at the second resolution; specifying a plurality of reference position identifiers in the second representation indicating positions of optically detectable reference markers at the second resolution; and determining a set of geometric descriptors describing spatial relations between the second target position identifier and the plurality of reference position identifiers to provide the position information.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
LEICA MICROSYSTEMSGERMANY WETZLAR

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HECHT, Frank Wetzlar, DE 30 120
SIECKMANN, Frank Wetzlar, DE 33 328

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation