APPARATUSES AND METHODS FOR TESTING SEMICONDUCTOR CIRCUITRY USING MICROELECTROMECHANICAL SYSTEMS SWITCHES

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20240402239A1
SERIAL NO

18800842

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Abstract

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An apparatus is provided that is implemented to enable multiple tests of different types, such as a direct current (DC) test and/or a radio frequency (RF) test of a semiconductor device. The apparatus includes a microelectromechanical systems (MEMS) switch block coupled between the semiconductor device and automatic testing equipment (ATE). The apparatus is configured to enable/disable a DC path or an RF path to switch between a DC test and an RF test without reconfiguring the connections between the semiconductor device and the ATE. The DC path is used to perform a DC contact test for one or more pins of the semiconductor device. The RF path is used to perform an RF test for the semiconductor device.

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Patent Owner(s)

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ANALOG DEVICES INTERNATIONAL UNLIMITED COMPANYLIMERICK

International Classification(s)

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  • 2024 Application Filing Year
  • G01R Class
  • 2121 Applications Filed
  • 109 Patents Issued To-Date
  • 5.14 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Acar, Erkan Melrose, US 10 14
Carty, Eric James Limerick, IE 4 15
Dhull, Naveen Limerick, IE 4 0
Fitzgerald, Padraig Mallow, IE 23 59
McGuinness, Patrick M Limerick, IE 19 157
Nolan, Derek W Tralee, IE 2 0
Oltman, Randy Andover, US 5 139

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges528724401 - 10025050075010001250150017502000225025002750300032503500375040004250450047505000525055005750

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