SCANNING PROBE MICROSCOPE AND PROGRAM

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20240402215A1
SERIAL NO

18696237

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A scanning probe microscope according to one aspect of the present disclosure divides an observation target region of a sample into a plurality of regions, and drives a scanner to scan the surface of the sample for each region. The data processing unit acquires image data corresponding to the respective regions in the plurality of regions. The input means accepts a user input regarding the acquisition conditions for the plurality of pieces of image data. The acquisition conditions include scanning conditions of the scanner. When the input means accepts a user input for any two variables out of three variables consisting of a scanning range of the scanner for each image data, a spacing between two adjacent scanning ranges, and a maximum number of fields of view capable of being obtained from a maximum scanning range of the scanner, the data processing unit is configured to calculate a remaining one of the three variables based on the accepted two variables.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
SHIMADZU CORPORATION1 NISHINOKYO KUWABARA-CHO NAKAGYO-KU KYOTO-SHI KYOTO 604-8511

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
ARAI, Hiroshi Kyoto-shi, JP 137 1407
MORIGUCHI, Shiho Kyoto-shi, JP 2 0
NAKAJIMA, Hideo Kyoto-shi, JP 48 626
NAKANO, Chiharu Fukuchiyama-shi, JP 6 4

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation