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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
SYSMEX CORPORATION	KOBE-SHI HYOGO 651-0073

International Classification(s)

• G06T:IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
• G01N:INVESTIGATING OR ANALYSING MATERIALS BY DETERMININ....

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• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
HIRAYAMA, Hideki	Kobe-shi, JP	90	670
NAGAI, Takaaki	Kobe-shi, JP	109	1101
TATSUTANI, Hiroo	Kobe-shi, JP	36	153
TSUJI, Tomohiro	Kobe-shi, JP	76	412

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date
3.5 Year Payment	$1600.00	$800.00	$400.00	Jun 5, 2028
7.5 Year Payment	$3600.00	$1800.00	$900.00	Jun 5, 2032
11.5 Year Payment	$7400.00	$3700.00	$1850.00	Jun 5, 2036

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge - 3.5 year - Late payment within 6 months	$160.00	$80.00	$40.00
Surcharge - 7.5 year - Late payment within 6 months	$160.00	$80.00	$40.00
Surcharge - 11.5 year - Late payment within 6 months	$160.00	$80.00	$40.00
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

Full Text

US Patent Application No: 2024/0402,179

SPECIMEN MEASUREMENT SYSTEM AND SPECIMEN MEASUREMENT METHOD

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