TEMPERATURE CALIBRATION SYSTEM, INSPECTION APPARATUS, AND TEMPERATURE CALIBRATION METHOD
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United States of America
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Issued Date -
Dec 5, 2024
app pub date -
Sep 15, 2022
filing date -
Sep 15, 2022
priority date (Note) -
Published
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Abstract
A temperature calibration system includes: an inspection apparatus to adjust temperature of an inspection target in a placement part and inspect the inspection target; and a surface thermometer, and is configured to calibrate temperature sensors in the placement part. The inspection apparatus includes: a carriage to move the placement part in X-, Y-, and Z-axis directions; and a controller to perform a calibration process to measurement values of the temperature sensors. The surface thermometer is configured to contact a placement surface of the placement part and detect a surface temperature of the placement surface. The controller is configured to: control the carriage to contact the surface thermometer with a detection position of the placement surface of the placement part; detect the surface temperature of the detection position by the surface thermometer; and calibrate the measurement value of the temperature sensor corresponding to the detection position based on the surface temperature.

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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
TOKYO ELECTRON LIMITED | TOKYO |
International Classification(s)

- [Classification Symbol]
- [Patents Count]
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
FUJII, Fumiya | Yamanashi, JP | 2 | 0 |
KASAI, Shigeru | Yamanashi, JP | 140 | 5035 |
MURATA, Yasuhiro | Yamanashi, JP | 9 | 13 |
OTA, Tomohiro | Yamanashi, JP | 61 | 661 |
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