TRANSISTOR CONTACTS AND METHODS OF FORMING THE SAME

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United States of America

APP PUB NO 20240395871A1
SERIAL NO

18790792

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Abstract

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In an embodiment, a device includes: a gate structure on a channel region of a substrate; a gate mask on the gate structure, the gate mask including a first dielectric material and an impurity, a concentration of the impurity in the gate mask decreasing in a direction extending from an upper region of the gate mask to a lower region of the gate mask; a gate spacer on sidewalls of the gate mask and the gate structure, the gate spacer including the first dielectric material and the impurity, a concentration of the impurity in the gate spacer decreasing in a direction extending from an upper region of the gate spacer to a lower region of the gate spacer; and a source/drain region adjoining the gate spacer and the channel region.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MFG CO LTDNO 8 LI-HSIN RD 6 SCIENCE-BASED INDUSTRIAL PARK HSIN-CHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Huicheng Tainan City, TW 270 1020
Chen, Liang-Yin Hsinchu, TW 145 512
Chen, Wen-Yen Hsinchu, TW 60 853
Chien, Wei-Ting Hsinchu, TW 39 78
Liu, Su-Hao Jhongpu Township, TW 98 950
Wang, Li-Ting Hsinchu, TW 110 1191

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