METHOD FOR FABRICATING SEMICONDUCTOR DEVICE

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United States of America

APP PUB NO 20240395550A1
SERIAL NO

18789485

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Abstract

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A method for fabricating a semiconductor device is provided. The method includes coating a photoresist film over a target layer over a semiconductor substrate; performing a lithography process to pattern the photoresist film into a photoresist layer; performing a directional ion bombardment process to the photoresist layer along a direction tilted with respect to a normal direction of the semiconductor substrate, such that a carbon atomic concentration in the photoresist layer is increased; and etching the target layer using the photoresist layer as an etch mask.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD8 LI-HSIN RD 6 HSINCHU SCIENCE PARK HSINCHU 300-78

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHANG, Chun-Yen Hsinchu City, TW 76 808
CHANG, Hsiang-Ming Hsinchu City, TW 5 0
CHANG, Ya-Hui Hsinchu City, TW 26 81
CHEN, Chia-Cheng Hsinchu City, TW 140 822
CHEN, Liang-Yin Hsinchu City, TW 145 512
CHIEN, Wei-Ting Hsinchu City, TW 39 78
SHEN, Yu-Tien Tainan City, TW 40 65
YANG, Chih-Kai Taipei City, TW 112 607

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