SINGLE-POINT SAMPLING OPTIMIZATION METHOD AND SYSTEM FOR FREQUENCY RESPONSE MEASUREMENT

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United States of America

APP PUB NO 20240393378A1
SERIAL NO

18736991

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Abstract

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The present disclosure discloses a single-point sampling optimized method and system for frequency response measurement. The frequency response measurement based on sinusoidal excitation is regarded as frequency domain sampling of system under test, the interpolation error between piecewise linear interpolation model of existing sampling value and the theoretical model of the system under test is estimated, and a single newly added sampling point is placed in the sub-frequency band with maximum interpolation error, so as to achieve steepest descent of an overall interpolation error. The present disclosure does not rely on specific hardware, is directly embedded into existing frequency response analyzer, has high usability, high precision and high stability, and has good data inheritance.

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Patent OwnerAddress
XI'AN JIAOTONG UNIVERSITYNO 28 XIANNING WEST ROAD BEILIN DISTRICT XI'AN SHAANXI 710048 710048

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
LIU, Jinjun Xi'an, CN 23 150
LIU, Zipeng Xi'an, CN 2 2

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