TEST APPARATUS AND TEST METHOD THEREOF

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20240385220A1
SERIAL NO

18783575

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Abstract

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A test apparatus includes a movable stage to support a sample, tips above the stage that have different shapes and alternately perform profiling and milling on the sample, a tip stage connected to a cantilever coupled to the tips, the tip stage to adjust a position of the cantilever, a position sensor to obtain information about a positional relationship between the tips and the sample, a stage controller to control movements of the stage and the tip stage, based on the information about the positional relationship, and a tip controller to select the tips for performing the profiling or milling and to determine conditions for performing milling, wherein a depth of the sample being processed by the milling in the first direction is controlled based on a relationship between a distance between the tips and the sample and a force between the tips and the sample.

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Patent Owner(s)

Patent OwnerAddress
RYU SUNGYOONNot Provided

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HONG, Seungbum Daejeon, KR 20 304
KIM, Hoon Daejeon, KR 562 7664
KIM, Kwangeun Suwon-si, KR 9 1
KIM, Souk Seoul, KR 17 10
RYU, Sungyoon Seoul, KR 14 3
SOHN, Younghoon Seoul, KR 33 28
YANG, Yusin Seoul, KR 27 53
YEOM, Jiwon Daejeon, KR 3 0
YUN, Seokjung Iksan-si, KR 12 151

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