TEST SYSTEMS CONFIGURED TO TEST DEVICES AT DIFFERENT TEMPERATURES
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United States of America
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Issued Date -
Nov 21, 2024
app pub date -
May 15, 2023
filing date -
May 15, 2023
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Abstract
An example test system includes a plenum including an air inlet and a rack including slots to hold devices under test. The rack is adjacent to the plenum. The slots are arranged on the rack in a matrix such that part of each device held in a slot borders the plenum and is in fluid communication with the air inlet. One or more blowers are configured to force temperature-conditioned air into the air inlet of the plenum to thereby increase air pressure in the plenum and force the temperature-conditioned air over the devices and out of the plenum.
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