THIN FILM TRANSFER USING SUBSTRATE WITH ETCH STOP LAYER AND DIFFUSION BARRIER LAYER

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United States of America

APP PUB NO 20240379792A1
SERIAL NO

18782840

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Abstract

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A method of forming a semiconductor device includes: forming an etch stop layer over a substrate; forming a first diffusion barrier layer over the etch stop layer; forming a semiconductor device layer over the first diffusion barrier layer, the semiconductor device layer including a transistor; forming a first interconnect structure over the semiconductor device layer at a front side of the semiconductor device layer, the first interconnect structure electrically coupled to the transistor; attaching the first interconnect structure to a carrier; removing the substrate, the etch stop layer, and the first diffusion barrier layer after the attaching; and forming a second interconnect structure at a backside of the semiconductor device layer after the removing.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MFG CO LTDSCIENCE-BASED INDUSTRIAL PARK NO 121 PARK AVENUE 3 HSIN-CHU R O C

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Eugene I-Chun Taipei, TW 24 10
Chiang, Chen-Hao Jhongli City, TW 47 200
Lee, Ru-Liang Hsinchu, TW 81 472
Tsai, Chia-Shiung Hsinchu, TW 515 6971

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