IMAGE SENSOR WITH DIFFUSION BARRIER STRUCTURE

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20240379692A1
SERIAL NO

18779188

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Abstract

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The present disclosure relates to an integrated chip. The integrated chip includes a sensor semiconductor layer. The sensor semiconductor layer is doped with a first dopant. A photodetector is along a frontside of the sensor semiconductor layer. A backside semiconductor layer is along a backside of the sensor semiconductor layer, opposite the frontside. The backside semiconductor layer is doped with a second dopant. A diffusion barrier structure is between the sensor semiconductor layer and the backside semiconductor layer. The diffusion barrier structure includes a third dopant different from the first dopant and the second dopant.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD8 LI-HSIN RD 6 HSINCHU SCIENCE PARK HSINCHU 300-78

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Eugene I-Chun Taipei City, TW 24 10
Cheng, Yu-Hung Tainan City, TW 96 601
Chiang, Chen-Hao Jhongli City, TW 47 200
Kuo, Chin-Chia Tainan City, TW 27 57
Li, Ching I Tainan, TW 38 25

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