METHOD FOR GRINDING SEMICONDUCTOR WAFERS

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20240379342A1
SERIAL NO

18686906

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Abstract

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A semiconductor wafer is processed by grinding the semiconductor wafer so as to remove material using a grinding tool while delivering a coolant into a contact region between the rotating semiconductor wafer and the grinding tool. The grinding tool has grinding teeth having a height. While grinding, first and second coolant flow rates are respectively applied onto first and second regions on one side of the semiconductor wafer by one or more nozzles. The first region is bounded by a lower right quadrant of the semiconductor wafer and the second region is bounded by a lower left quadrant. A ratio of the first coolant flow rate and a sum of the first coolant flow rate and the second coolant flow rate is no more than 35% and no less than 25%.

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Patent Owner(s)

Patent OwnerAddress
SILTRONIC AGEINSTEINSTRASSE 172 81677 MÜNCHEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KERSTAN, Michael Burghausen, DE 17 136
OBERHANS, Stephan Seeon, DE 2 0
WEISS, Robert Winhoering, DE 78 485

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