CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20240377340A1
SERIAL NO

18660038

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Abstract

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Disclosed herein are systems and methods for detecting foreign material in a good. A system controls an X-ray machine to capture an image of a good. The system analyzes the image captured by the X-ray machine by applying one or more of a foreign material detection algorithm and a foreign material model to the image. The system determines whether the good includes a foreign material comprising a challenge card by detecting at least one marking component on the foreign material when analyzing the image, wherein the challenge card includes the at least one marking component and a challenge material.

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Patent Owner(s)

Patent OwnerAddress
GREYSCALE AI47690 WESTINGHOUSE DRIVE FREMONT CALIFORNIA 94539 94539

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dennehy, Mateo Vicente López, AR 1 0
Green, Brian Fairfax Station, US 52 765
Vaughn, Travis Odessa, US 1 0

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