MULTIPLEXER FOR SDFQ HAVING DIFFERENTLY-SIZED SCAN AND DATA TRANSISTORS, SEMICONDUCTOR DEVICE INCLUDING SAME AND METHODS OF MANUFACTURING SAME
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United States of America
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Issued Date -
Nov 7, 2024
app pub date -
Jul 12, 2024
filing date -
Jul 12, 2024
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Abstract
A semiconductor device includes first active regions extending in a first direction and having a first number of fins; second active regions extending in the first direction and having a second number of fins, the second number of fins being less than the first number of fins; data transistors formed at least in part in the first active regions; and scan transistors formed at least in part in the second active regions. The data transistors and the scan transistors are included in a scan insertion D flip-flop (SDFQ) that includes a multiplexer serially connected at an internal node to a D flip-flop (FF), the multiplexer including the data transistors for selecting a data input signal, and including the scan transistors for selecting a scan input signal.
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