INSPECTION APPARATUS AND INSPECTION METHOD

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20240369502A1
SERIAL NO

18776818

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An inspection apparatus for inspecting an inspection target surface arranged on an inspection plane, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection plane, and an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface. The X-ray detector includes a long X-ray receiver.

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Patent Owner(s)

Patent OwnerAddress
CANON ANELVA CORPORATION2-5-1 KURIGI ASAO-KU KAWASAKI-SHI KANAGAWA-KEN 2158550

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
TSUKAMOTO, Takeo Niigata, JP 217 3544

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