MEASURING ARRANGEMENT FOR EXAMINING A LIGHT-EMITTING DIODE ASSEMBLY AND METHOD
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United States of America Patent
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Issued Date -
Oct 24, 2024
app pub date -
Jun 30, 2022
filing date -
Jun 30, 2022
priority date (Note) -
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Abstract
In an embodiment a measuring arrangement includes a first supply connection, a second supply connection, at least one signal output, a reference potential connection, a voltage source arranged between the first supply connection and the reference potential connection, a source measuring unit arranged between the second supply connection and the reference potential connection and a controller coupled on an output side to the at least one signal output, wherein the first supply connection, the second supply connection, the at least one signal output and the reference potential connection are configured for connecting to a light-emitting diode assembly.
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