MULTI-LAYER HIGH-ASPECT RATIO X-RAY GRATING AND METHOD OF MANUFACTURE

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United States of America Patent

APP PUB NO 20240353353A1
SERIAL NO

18682988

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The disclosure is directed at a multi-layer, high-aspect ratio X-ray grating apparatus and method of fabrication. In one embodiment, the disclosure may include a self-alignment methodology, or process, combined with a multiple layer structure fabrication. The grating may include a substrate with a seed layer on top. The grating further includes at least one patterned non-X-ray absorbing layer and at least one X-ray absorbing layer atop the seed layer.

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Patent Owner(s)

Patent OwnerAddress
KARIM KARIM SWATERLOO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KARIM, Karim S Waterloo, CA 25 542
PIL-ALI, Abdollah Waterloo, CA 1 0

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