WEAK MEASUREMENT BASED SYSTEMS AND DEVICES FOR QUANTUM METROLOGY
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United States of America Patent
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Issued Date -
Oct 24, 2024
app pub date -
Apr 21, 2023
filing date -
Apr 21, 2023
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Abstract
Systems, devices, and methods are described herein that are employed in quantum metrology. An example quantum device includes a weak measurement module operably coupled with a quantum system. The weak measurement module is configured to apply one or more measurements to the quantum system and obtain information associated with the quantum system based on the one or more measurements. A strength of the one or more measurements by the weak measurement module is configured to prevent a wave function collapse associated with the quantum system. The quantum device further includes a data processing unit (DPU) operably coupled with the weak measurement module that performs one or more operations on the obtained information associated with the quantum system and provides improved time synchronization and networking features.
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