MEASURING SYSTEM
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United States of America Patent
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Issued Date -
Oct 17, 2024
app pub date -
Jul 19, 2022
filing date -
Jul 19, 2022
priority date (Note) -
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status (Latency Note)
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Abstract
A measuring system with which it is easy to manufacture a marker, and which is capable of high precision measurement. A marker to be measured by a measuring system is provided with a base material layer, a first layer which is laminated onto one surface of the base material layer and which is observed in a first color, and a second layer which is partially laminated onto the first layer, is observed in a second color different from the first color, and partially conceals the first layer, wherein the first layer is observable in a region in which the second layer is not laminated, and the second layer is formed by means of a resist material.
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