DECOUPLED OPTICAL FORCE NANOSCOPY
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United States of America Patent
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Issued Date -
Oct 17, 2024
app pub date -
Apr 12, 2024
filing date -
Apr 12, 2024
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Abstract
Decoupled optical force nanoscopy allows for measurements of optical forces with nanoscale spatial and temporal resolution. A sample is illuminated with temporally modulated laser light. Optical force data are measured by scanning a cantilever (e.g., of a scanning probe microscope) over the sample to measure optical forces generated by illuminating the sample with the temporally modulated laser light. The optical force data are analyzed in the frequency domain to separate the optical force data into different components, such as photothermal force components, optical gradient force components, photoacoustic force components, and the like.
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