RADIATION ANOMALY CHARACTERIZATION SYSTEM
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United States of America Patent
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Issued Date -
Oct 10, 2024
app pub date -
Apr 6, 2023
filing date -
Apr 6, 2023
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Abstract
A system for detecting radiation events, having: a test memory with memory blocks; a controller having controller memory; an integrated circuit (IC) array having IC chains, wherein each of the IC chains has a plurality of IC elements that is response to and generates a voltage when exposed to a radiation event; a dosimeter configured to record an accumulated amount of radiation exposure to the system, wherein the controller is configured to perform steps of: initializing the test memory, the IC array and the dosimeter; monitoring for an unexpected signal from an IC chain and for unexpected data in a memory block of the test memory; and identifying the radiation event upon one or more of receiving the unexpected signal and identifying unexpected data in a memory block of the test memory.
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