VIA STRUCTURE AND METHODS OF FORMING THE SAME

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United States of America Patent

APP PUB NO 20240334847A1
SERIAL NO

18738161

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Abstract

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A method includes providing a substrate having a conductive column, a dielectric layer over the conductive column, and a plurality of sacrificial blocks over the dielectric layer, the plurality of sacrificial blocks surrounding the conductive column from a top view; depositing a sacrificial layer covering the plurality of sacrificial blocks, the sacrificial layer having a dip directly above the conductive column; depositing a hard mask layer over the sacrificial layer; removing a portion of the hard mask layer from a bottom of the dip; etching the bottom of the dip using the hard mask layer as an etching mask, thereby exposing a top surface of the conductive column; and forming a conductive material inside the dip, the conductive material being in physical contact with the top surface of the conductive column.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING CO LTDNO 8 LI-HSIN RD 6 HSINCHU SCIENCE PARK HSINCHU 300-78

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Jieh-Jang Hsinchu County, TW 23 120
Hsu, Chern-Yow Hsin-Chu County, TW 143 877
Huang, Wei-Chieh Hsinchu County, TW 37 123
Shiu, Feng-Jia Hsinchu County, TW 62 349

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