PLASMA ENHANCED EPITAXIAL CHEMICAL VAPOR DEPOSITION SYSTEM

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United States of America Patent

APP PUB NO 20240331984A1
SERIAL NO

18620464

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Abstract

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Methods and apparatuses for a material layer deposition method in a semiconductor manufacturing system. A controller may seat a substrate on a substrate support. A silicon-containing material layer precursor may be provided to a remote plasma unit, which may decompose at least a portion of the silicon-containing material layer precursor. An epitaxial material layer comprising silicon may be deposited onto the substrate using a decomposition product. The deposition rate and/or growth rate may be increased at a given deposition temperature.

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Patent Owner(s)

Patent OwnerAddress
ASM IP HOLDING B VALMERE

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Demos, Alexandros Scottsdale, US 37 2300
Lu, Yanfu Phoenix, US 12 3

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