SEMICONDUCTOR DEVICE AND TEST METHOD

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20240329123A1
SERIAL NO

18607535

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The disclosure provides a semiconductor device including a plurality of reception circuit blocks each individually receiving a data signal, performing predetermined signal processing for the received data signal, and receiving a test mode signal for instructing a normal operation or a test operation. Each of the plurality of reception circuit blocks includes a PLL circuit generating a clock signal phase-synchronized with a data signal received by itself; a first selector selecting, based on the test mode signal, one of the clock signal generated by the PLL circuit of a different reception circuit block other than a reception circuit block of itself of the plurality of reception circuit blocks and the clock signal generated by the PLL circuit of the reception circuit block of itself, and a signal processing circuit performing the predetermined signal processing in synchronization with the clock signal selected by the first selector.

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Patent Owner(s)

Patent OwnerAddress
LAPIS TECHNOLOGY CO LTD2-4-8 SHINYOKOHAMA KOUHOKU-KU YOKOHAMA-SHI KANAGAWA 222-8575

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
MIYAZAKI, Hirokazu Yokohama, JP 16 349

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