WAFER MANUFACTURING METHOD

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20240326174A1
SERIAL NO

18735769

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A wafer manufacturing method for obtaining a wafer from an ingot includes the following procedure, steps or processes. A surface of one end side of the ingot in a height direction thereof is irradiated with a laser beam to which the ingot has transparency, thereby forming a peeling layer at a depth position corresponding to a thickness of the wafer from the surface. At this moment, the laser beam is irradiated such that a frequency of irradiation in a facet region is higher than that in a non-facet region. A wafer precursor as a portion between the surface of the ingot and the peeling layer is peeled from the ingot at the peeling layer. A major surface of a peeling body having a plate like shape, the peeling body being obtained by the wafer peeling step, is planarized electrically, chemically and mechanically, thereby obtaining a wafer.

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Patent Owner(s)

Patent OwnerAddress
DENSO CORPORATION1-1 SHOWA-CHO KARIYA-CITY AICHI 4488661 ?4488661

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KAWAZU, Tomoki Kariya-city, JP 5 3
NOMURA, Sodai Kariya-city, JP 5 3
SHIRAI, Hideaki Kariya-city, JP 29 143
SOBAJIMA, Shunsuke Kariya-city, JP 4 0
SOLTANI, Bahman Kariya-city, JP 11 3
TAKAGI, Ryota Kariya-city, JP 15 88
YASUDA, Koichiro Kariya-city, JP 5 4

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