RESISTANCE CALIBRATION AND MONITORING OF THERMAL SYSTEMS
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United States of America Patent
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Sep 26, 2024
app pub date -
Jun 5, 2024
filing date -
Apr 8, 2020
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Abstract
A method of calibrating temperature of a resistive element includes: generating a standard resistance-temperature (R-T) curve for the resistive element in an isothermal condition, wherein the resistive element comprises a material with a Curie temperature; generating an operational R-T curve for the resistive element during a normal operation of the resistive element; shifting the operational R-T curve toward the standard R-T curve at the Curie temperature to generate an adjusted operational R-T curve; and adjusting a measured temperature of the resistive element based on a resistance of the resistive element and the adjusted operational R-T curve.
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