RESIST UNDERLAYER FILM-FORMING COMPOSITION CONTAINING ACID CATALYST-SUPPORTING POLYMER

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United States of America Patent

APP PUB NO 20240310730A1
SERIAL NO

18281833

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Abstract

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The present invention provides a composition for forming a resist underlayer film with which a desired resist pattern can be formed, a method for manufacturing a resist pattern wherein said resist underlayer film-forming composition is used, and a method for manufacturing a semiconductor device. The resist underlayer film-forming composition includes a polymer that supports an acid compound at a terminal end thereof, and a solvent. The acid compound may be ionically bonded to a base that is present at the terminal end of the polymer. Said terminal end may be represented by formula (1) (in the formula, A1 represents an acid compound, B represents a basic structure, and * represents a section of bonding with a polymer moiety).

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Patent Owner(s)

Patent OwnerAddress
NISSAN CHEMICAL CORPORATION5-1 NIHONBASHI 2-CHOME CHUO-KU TOKYO 103-6119

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
SHIMIZU, Shou Toyama-shi, JP 13 3
TAMURA, Mamoru Toyama-shi, JP 45 230
WAKAYAMA, Hiroyuki Toyama-shi, JP 33 193

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