Importance

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Abstract

A semiconductor memory device of the embodiment includes first to fourth gate electrode layers which extend in a first direction, a first semiconductor layer which extends in a second direction intersecting the first direction and is provided between the first gate electrode layer and the third gate electrode layer, and between the second gate electrode layer and the fourth gate electrode layer, a first wiring layer which extends in a third direction intersecting the first direction and the second direction and is electrically connected to the first gate electrode layer, a second wiring layer which is electrically connected to the second gate electrode layer, a third wiring layer which extends in the third direction and is electrically connected to the third gate electrode layer, and a fourth wiring layer which extends in the third direction and is electrically connected to the fourth gate electrode layer. The first wiring layer is provided between the third wiring layer and the fourth wiring layer, and the second wiring layer is provided between the first wiring layer and the fourth wiring layer.

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First Claim