SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS

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United States of America Patent

APP PUB NO 20240304436A1
SERIAL NO

18546140

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Abstract

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Provided are a substrate processing method and a substrate processing apparatus that improve an etching resistance and suppress a film stress. A substrate processing method of forming a carbon-based film on a substrate includes: a process of placing the substrate on a stage; a first film forming process of forming a first carbon-based film having a first stress; a second film forming process of forming a second carbon-based film having a second stress; and a third film forming process of repeating the first film forming process and the second film forming process to form a stacked body of the first carbon-based film and the second carbon-based film, wherein the first stress and the second stress are oriented in a same direction, and the first stress and the second stress have different intensities.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITED3-1 AKASAKA 5-CHOME MINATO-KU TOKYO 1076325 ?1076325

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KANEKO, Miyako Nirasaki City, Yamanashi, JP 23 190
SUZUKI, Naoko Nirasaki City, Yamanashi, JP 30 311

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