PLASMA PROCESSING WITH INDEPENDENT TEMPERATURE CONTROL

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United States of America Patent

APP PUB NO 20240304422A1
SERIAL NO

18668480

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Abstract

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Embodiments of the present disclosure generally relate to inductively coupled plasma sources and plasma processing apparatus. In at least one embodiment, a plasma processing method includes introducing a gas including helium and nitrogen into a gas injection channel of a plasma source. The method includes generating a plasma within the gas injection channel. The plasma includes helium radicals and nitrogen radicals. The method includes delivering the plasma from the plasma source to a process chamber including a substrate. The method includes producing a treated substrate by processing the substrate with the plasma within the process chamber, in which processing the substrate includes contacting the plasma including the helium radicals and nitrogen radicals with a first side of the substrate.

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Patent Owner(s)

Patent OwnerAddress
APPLIED MATERIALS INCSANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HUANG, Lily Santa Clara, US 14 402
LIU, Wei Beijing, CN 1976 15390
NIYOGI, Sandip Oakland, US 27 665
VADLADI, Dileep Venkata Sai Sunnyvale, US 2 0

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