BUILT-IN SELF TEST CIRCUIT FOR MEASURING PERFORMANCE OF CLOCK DATA RECOVERY AND SYSTEM-ON-CHIP INCLUDING THE SAME

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United States of America Patent

APP PUB NO 20240302432A1
SERIAL NO

18597499

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Abstract

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A system-on-chip includes a clock generation circuit configured to generate a reference clock of a first phase; a transmission circuit comprising a serializer configured to serialize data according to the reference clock of the first phase; a reception circuit comprising a clock data recovery (CDR) circuit configured to receive the serialized data and generate a first recovery clock and recovery data; and a Built In Self Test (BIST) circuit including a CDR performance monitoring circuit configured to generate a control signal provided to a delay controller configured to delay a clock signal by a preset phase difference, and the delay controller configured to delay the clock signal in response to the control signal by the preset phase difference and provide the delayed clock signal to the transmission circuit.

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Patent Owner(s)

Patent OwnerAddress
SAMSUNG ELECTRONICS CO LTDGYEONGGI DO SOUTH KOREA GYEONGGI-DO

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hwang, Insik Suwon-si, KR 1 0
Kim, Jiyoung Suwon-si, KR 112 411
Lee, Juyun Suwon-si, KR 8 32
Lee, Sooeun Suwon-si, KR 4 1
Park, Jaehyun Suwon-si, KR 145 230
SONG, Hobin Suwon-si, KR 8 8

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