ION IRRADIATION OF MICROELECTROMECHANICAL RESONATORS

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United States of America Patent

APP PUB NO 20240297630A1
SERIAL NO

18584112

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Abstract

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A method of enhancing an electromechanical coupling coefficient of a microelectromechanical (“MEMS”) device. The method includes applying, to a fully fabricated MEMS device, heavy particle ion radiation to the MEMS device at a fluence of at least 1×1014 cm−2. According to other embodiments of the present invention are directed to a bandpass filter comprising a plurality of MEMS devices fabricated in accordance with the methods provided. The MEMS of the plurality are electronically or mechanically coupled.

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Patent Owner(s)

Patent OwnerAddress
GOVERNMENT OF THE UNITED STATES AS REPRESENTED BY THE SECRETARY OF THE AIR FORCE2240 B STREET BLDG 11 RM AFMCLO/JAZ WRIGHT-PATTERSON AFB OH 45433

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chandrahalim, Hengky Beavercreek, US 11 29
Lynes, David Wright-Patterson AFB, US 2 116

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