AI-BASED SYSTEM AND METHOD OF DETECTING DEFECT OF MATERIAL CONSIDERING KIND AND DISTRIBUTION OF REAL DEFECT
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United States of America Patent
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Issued Date -
Sep 5, 2024
app pub date -
May 12, 2024
filing date -
Nov 15, 2021
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Abstract
A method of generating a defect image of material based on artificial intelligence and a system for detecting a defect are disclosed. The system includes a learning data generating unit configured to generate multiple synthetic good quality images or synthetic defect images using a defect image, a learning unit configured to learn a model for detection of a defect by using the generated synthetic good quality images or the generated synthetic defect images and a defect detecting unit configured to detect a defect of an input image using the learned model. Here, the learning data generating unit detects a shape of the defect or a shape of a background by analyzing a kind or a distribution of the defect image, and generate different kind, number or resolution of the synthetic good quality image or the synthetic defect image depending on the detected shape of the defect or the detected shape of the background.
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