POSITIONING SYSTEM AND METHOD
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United States of America Patent
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Sep 5, 2024
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Jan 24, 2022
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Jan 25, 2021
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Abstract
A grid plate encoder based positioning system (1) for positioning of an element is provided, the positioning system (1) comprises
- a grid plate (2) with a grid plate surface (21);an encoder unit (3) with one or more optical sensors (31) for sensing a grid plate surface pattern (23) of the grid plate surface (21);an input (7) to receive coordinates (Xd, Yd) specifying a desired position of the element;a mapping unit (8) to compute compensated coordinate data (Xa, Ya) corresponding to estimated position data expected from the encoder unit (3) when the element is positioned at a desired position (Xd, Yd) specified by the setpoint coordinates;a feedback control unit (9) providing the compensated coordinate data (Xa, Ya) as a setpoint (Xs, Ys) to a positioning unit (12), with feedback control based on the estimated position data obtained from the encoder unit.
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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
NEARFIELD INSTRUMENTS B V | 3047 AT ROTTERDAM |
International Classification(s)

- 2022 Application Filing Year
- G01Q Class
- 73 Applications Filed
- 28 Patents Issued To-Date
- 38.36 % Issued To-Date
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
SADEGHIAN, MARNANI Hamed | Rotterdam, NL | 60 | 47 |
# of filed Patents : 60 Total Citations : 47 | |||
TOACSEN, Ioan-Andrei | Eindhoven, NL | 2 | 0 |
# of filed Patents : 2 Total Citations : 0 |
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3.5 Year Payment | $1600.00 | $800.00 | $400.00 | Mar 5, 2028 |
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Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
Full Text
US Patent Application No: 2010/0225,928
DEVICE FOR MEASURING STRUCTURES OF AN OBJECT
Abstract
A device for measuring structures of an object. The device includes a probe element extending from a probe extension, an optical sensor for capturing an image of the probe element on a sensor field, an evaluation unit configured to compute the structures based on a position of the optical sensor relative to a coordinate system of a coordinate measuring machine and from a position of the probe element measured by the optical sensor. The device also includes a lens disposed on the probe extension between the optical sensor and the probe element.
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