SYSTEMS AND METHODS FOR MEASURING STRUCTURAL ELEMENT DEFLECTIONS
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United States of America Patent
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Sep 5, 2024
app pub date -
Oct 2, 2023
filing date -
Feb 4, 2019
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Abstract
System and apparatus for monitoring a structural element includes a magnetometer capable of being mounted on the structural element, a magnet capable of being mounted on a surface adjacent the structural element so that the magnetometer is positioned within a magnetic field of the magnet; and a computing device capable of being communicatively coupled to the magnetometer, the magnetometer measuring characteristics of the magnetic field of the magnet, the computing device determining deflection of the structural element based on the measured characteristics of the magnetic field and a mathematical relationship between characteristics of the magnetic field and position of the magnetometer in relation to the magnet.
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