REFLECTIVE PHOTOMASK AND METHOD FOR MANUFACTURING REFLECTIVE PHOTOMASK

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20240288763A1
SERIAL NO

18570541

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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There are provided a reflective photomask capable of reducing the shadowing effect and a method for manufacturing the reflective photomask. A reflective photomask (100) according to one aspect of the present disclosure includes: a substrate (11)); a reflective layer (12) having a multi-layer film structure formed on the substrate (11) and configured to reflect an EUV light; a protective layer (13) formed on the reflective layer (12) and configured to protect the reflective layer (12); and an absorption pattern layer (14a) formed on the protective layer (13) and formed with a pattern and configured to absorb the EUV light; in which the absorption pattern layer (14a) contains a material having an extinction coefficient k to the EUV light larger than 0.041, and a side wall angle θ formed by the side wall of the absorption pattern layer (14a) and the substrate (11) is less than 90°.

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Patent Owner(s)

Patent OwnerAddress
TEKSCEND PHOTOMASK CORP1-5-2 HIGASHI-SHIMBASHI MINATO-KU TOKYO 1057133 ?1057133

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
GODA, Ayumi Tokyo, JP 14 0
ICHIKAWA, Kenjiro Tokyo, JP 11 0
MIYAWAKI, Daisuke Tokyo, JP 19 42
NAKANO, Hideaki Tokyo, JP 22 163
YAMAGATA, Yuto Tokyo, JP 7 0

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