Importance

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Abstract

Devices and methods for the spectrometric analysis of sample material located in an ablation area on a sample support are disclosed, including a mode of operation which comprises: (i) locating the ablation area on the sample support and determining an ablation area dimension between opposing boundaries of the ablation area; (ii) beam-assisted sampling from the ablation area, e.g., using MALDI, and mass analyzing, e.g., using an IMS-QoTOF analyzer, the ablated and/or desorbed and ionized sample material, wherein a beam impingement region, which is selected no larger than the dimension of the ablation area, is moved within the boundaries of the ablation area while performing ablation and/or desorption operations and an extension of the beam impingement region is changed at least once; and (iii) combining the molecular information obtained by the ablation and/or desorption operations from the ablation area into a single spectral dataset.

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First Claim