Accelerating Machine Vision with Peripheral and Focal Processing using Artificial Neural Networks

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United States of America Patent

APP PUB NO 20240282074A1
SERIAL NO

18415380

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Abstract

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Different machine vision acuity levels for anomaly detection in an image. An image sensing pixel array generates image data representative of the image having a first region (e.g., focal region) and a second region (e.g. periphery). A memory cell array stores a first weight matrix representative of a first kernel of a convolutional neural network and a second weight matrix representative of a second kernel. A logic circuit can apply the first kernel to the first region using the first weight matrix to generate first feature data at a first stride length with quantization at a first precision level. The logic circuit can apply the second kernel to the second region using the second weight matrix to generate second feature data at a second stride length with quantization at a second precision level.

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Patent Owner(s)

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MICRON TECHNOLOGY INC8000 SOUTH FEDERAL WAY MAILSTOP 1-507 BOISE ID 83707-0006

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kale, Poorna Folsom, US 246 1287
Lakshman, Shashank Bangalore Folsom, US 7 0
Tiku, Saideep Folsom, US 52 12

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