DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING METHOD

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United States of America Patent

APP PUB NO 20240280606A1
SERIAL NO

18567158

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Between a nitrogen-vacancy center and a support portion, a cut-off portion is provided that cuts off the nitrogen-vacancy center from the support portion.

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Patent Owner(s)

Patent OwnerAddress
HITACHI LTDJAPAN

International Classification(s)

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  • 2022 Application Filing Year
  • G01Q Class
  • 73 Applications Filed
  • 28 Patents Issued To-Date
  • 38.36 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances20222023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KOGUCHI, Masanari Tokyo, JP 30 665

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Patent Citation Ranking

  • 0 Citation Count
  • G01Q Class
  • 0 % this patent is cited more than
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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges134101 - 100102030405060708090100110120130140150

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