ANALYSIS METHOD AND ANALYSIS DEVICE

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United States of America Patent

APP PUB NO 20240280476A1
SERIAL NO

18571281

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The analysis device is provided with multiple reference samples which differ in transmittance and color, a storage unit which stores the brightness values, and a control value of the light source. The control unit irradiates the reference sample with light at a set control value, and stores an acquired measured brightness value of the reference sample, and an adjustment control value of the light source for adjusting to a set reference brightness value; from the brightness value of a sample to be measured, which was acquired by irradiating the sample to be measured with light on the basis of the control value, the control unit calculates an adjustment control value of the light source on the basis of the relation between the adjustment control value of the light source and the brightness value of the sample to be measured, and uses the adjustment control value to irradiate light.

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Patent Owner(s)

Patent OwnerAddress
HITACHI HIGH-TECH CORPORATION17-1 TORANOMON 1-CHOME MINATO-KU TOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
ISHII, Naomi Tokyo, JP 9 33
MIZUNO, Megumi Tokyo, JP 6 49
NARIKAWA, Sakiko Tokyo, JP 13 155

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