DEVICE AND METHOD FOR ANALYZING A GASEOUS SAMPLE, AND RAMAN SPECTROMETER
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United States of America Patent
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Issued Date -
Aug 22, 2024
app pub date -
Jun 27, 2022
filing date -
Jul 9, 2021
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Abstract
A device for analyzing a gaseous sample in respect of a composition of the particles contained in the sample, the device including the following components: a device for sucking in the gaseous sample, a device for separating the particles contained in the gaseous sample on the basis of a diameter of the particles, a device for collecting the particles, a sensor device for analyzing the particles contained in the gaseous sample and a device for evaluating spectra. The sensor device operates on the basis of Raman scattering and is configured to produce the spectra to be evaluated. In particular, the evaluation can be implemented by way of a comparison of the produced spectra with reference spectra, with these reference spectra possibly describing different forms of existence of silicon dioxide in particular. A method for analyzing a gaseous sample in respect of a composition of the particles contained in the sample, and to a Raman spectrometer which may be a constituent part of the proposed device.
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