Apparatus and Method to Detect Residual Stress Around Cold Expanded Holes Using Longitudinal Critically Refracted Waves
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United States of America Patent
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Issued Date -
Aug 22, 2024
app pub date -
Feb 19, 2024
filing date -
Feb 20, 2023
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Abstract
A method for detecting residual stress induced by cold expansion (Cx) (Cx stress) at a hole in a structure. Two transducer pairs transmit and receive ultrasonic waves into the structure in a pitch-catch configuration along two first paths parallel to a tangent of the hole. The two paths are at different distances from the hole. Both transducer pairs are arranged such that their incident angle into the structure provides longitudinal critically refracted (LCR) waves within the structure. Time-of-flight (ToF) measurements of the LCR waves along the first path and the second path are the basis of acoustoelasticity calculations that determine if Cx stress is present at the hole.
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