SUBSTRATE POSITION MONITORING DEVICES

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United States of America Patent

APP PUB NO 20240274401A1
SERIAL NO

18434139

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An instrumented substrate is used in a substrate processing system to determine offsets to a chuck and a focus ring. The instrumented substrate includes line sensors which generate line images and a controller which determines the offsets based on the line images. A substrate handler then repositions the instrumented substrate to reduce the offsets.

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Patent Owner(s)

Patent OwnerAddress
KLA CORPORATIONONE TECHNOLOGY DRIVE MILPITAS CA 95035

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bella, James Richard San Jose, US 4 1
Buettner, Alexander Weilburg, DE 15 93
Jensen, Earl Santa Clara, US 24 215
Saerchen, Emanuel Langgoens, DE 3 6

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