Method for establishing transistor statistical model based on artificial neural network system
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United States of America Patent
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Aug 15, 2024
app pub date -
Jan 31, 2024
filing date -
Feb 15, 2023
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Abstract
A method of establishing a transistor statistical model based on an artificial neural network system comprising receiving a first data set and generating a nominal model of a baseline transistor by the artificial neural network system based on the first data set; screening neurons in the artificial neural network system based on the first data set and the nominal model to obtain final variational neurons; obtaining distribution of weights of the final variational neurons and distribution of threshold voltages based on variation of the nominal model with respect to weights of the final variational neurons, variation of the nominal model with respect to the threshold voltages, distribution of the drain-source current and distribution of the gate-source voltage in the first data set; and establishing the transistor statistical model based on the nominal model, the distribution of weights of the final variational neurons and the distribution of the threshold voltages.
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