ATOMIC MAGNETOMETER WITH EXTENDED MEASUREMENT BANDWIDTH

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United States of America Patent

APP PUB NO 20240272243A1
SERIAL NO

18405506

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Abstract

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An atomic magnetometer with an extended measurement bandwidth is disclosed. The atomic magnetometer includes coils configured to transmit incident pump light and a bias magnetic field and a vapor cell positioned between the coils and receiving the pump light and the bias magnetic field transmitted from the coils and irradiation light incident from a direction perpendicular to the coils, wherein the vapor cell includes both a first alkali metal atom and a second alkali metal atom, which are isotopes of one of alkali metals.

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Patent Owner(s)

Patent OwnerAddress
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTEDAEJEON KOREA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHO, In Kui Daejeon, KR 85 635
KIM, Jang Yeol Daejeon, KR 29 29
LEE, Hyunjoon Daejeon, KR 24 123
OH, Jung Hoon Daejeon, KR 43 112

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