A METHOD OF EXAMINING A SAMPLE IN AN ATOMIC FORCE MICROSCOPE USING ATTRACTIVE TIP-TO-SAMPLE INTERACTION
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United States of America Patent
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Aug 8, 2024
app pub date -
Jul 13, 2021
filing date -
Jul 13, 2021
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Abstract
A method of examining a sample in an atomic force microscope including at least one probe, each probe including at least one cantilever and at least one tip includes carrying out a negative setpoint setting procedure, wherein the negative setpoint SCD is set as a negative real number, an approaching procedure including: above at least one point of the sample, performing an approach including reducing the tip-to-sample distance and recording cantilever deflection as a function of the tip-to-sample distance, while applying the standard sign convention with cantilever deflection considered negative for attractive forces and positive for repulsive forces, until at least one of critical criteria is achieved, and pausing or stopping of the approach after performing the approaching procedures.
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