SOURCE OR DRAIN STRUCTURES FOR GERMANIUM N-CHANNEL DEVICES

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United States of America Patent

APP PUB NO 20240258427A1
SERIAL NO

18605406

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Abstract

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Integrated circuit structures having source or drain structures and germanium N-channels are described. In an example, an integrated circuit structure includes a fin having a lower fin portion and an upper fin portion, the upper fin portion including germanium. A gate stack is over the upper fin portion of the fin. A first source or drain structure includes an epitaxial structure embedded in the fin at a first side of the gate stack. A second source or drain structure includes an epitaxial structure embedded in the fin at a second side of the gate stack. Each epitaxial structure includes a first semiconductor layer in contact with the upper fin portion, and a second semiconductor layer on the first semiconductor layer. The first semiconductor layer comprises silicon, germanium and phosphorous, and the second semiconductor layer comprises silicon and phosphorous.

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Patent Owner(s)

Patent OwnerAddress
INTEL CORPCALIFORNIA USA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
AGRAWAL, Ashish Hillsboro, US 135 1695
BASU, Dipanjan Hillsboro, US 18 68
CAO, Yang Beaverton, US 306 2907
CHU-KUNG, Benjamin Portland, US 218 2483
KEECH, Ryan Portland, US 24 51
KENNEL, Harold Portland, US 33 164
MERRILL, Devin McMinnville, US 6 6
MURTHY, Anand Portland, US 200 4339
RAFIQUE, Subrina Hillsboro, US 13 21
TORRES, Jessica Portland, US 10 41

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