Components analysis apparatus and components analysis method

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United States of America Patent

APP PUB NO 20240257919A1
SERIAL NO

18443317

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Abstract

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Provided is a component analyzing device 1 including: a projection unit 11 which projects light on an object; a measurement unit 12 which detects reflected light, scattered light, or emitted light from the object and measures a content of a related substance, which is contained together with a target substance in the object, from a detection result; and an estimation unit 13 which estimates a content of the target substance from a measurement result of the content of the related substance, based on a quantitative relationship between the target substance and the related substance derived from a reaction equation system based on a biosynthetic metabolic pathway of the object.

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Patent Owner(s)

Patent OwnerAddress
RIKEN2-1 HIROSAWA WAKO-SHI SAITAMA 3510198 ?3510198

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
OGAWA, Takayo Saitama, JP 8 2
TAKETANI, Akinori Saitama, JP 1 0
WADA, Satoshi Saitama, JP 296 3471

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