MEASURING SYSTEM AND MEASUREMENT METHOD
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United States of America Patent
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Issued Date -
Jul 18, 2024
app pub date -
Jan 12, 2024
filing date -
Jan 13, 2023
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Abstract
A measuring system includes: a measuring machine; a plurality of candidate probes attachable to the measuring machine; a selected probe selected from the candidate probes and attached to the measuring machine; and a control device configured to control the measuring machine to perform a measurement operation for a workpiece, the control device including: a calibration value recorder configured to record respective calibration values of the candidate probes with respect to the measuring machine; and a calibration value processor configured to acquire one of the calibration values corresponding to the selected probe from the calibration value recorder.
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